HED-W5300D

Full Automatic Wafer ESD Tester

HED-W5300D is a new model of HED-W5100D and can control a wafer stage automatically.

This tester can start measurement by only set your wafer on the stage.

It can provide you the best value in increased operational efficiency for measurement.

Also, normal IC packages can be measured by this tester.

HED-W5100D

Full Automatic Wafer ESD Tester

◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.

◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.

◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.

◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.

Option the HMM Zap (IEC 61000-4-2) available

HED-W5000M

High Performance Manual Wafer ESD Tester

◆Real device's ESD waveform The real device's ESD waveform can be displayed.

◆On wafer, assured waveform Standard waveform for HBM/MM is assumed on wafer.

◆Realization to achieve the automatic destruction judgment of just after zap Allows to implement the destruction judgment by Vf/If measurement after pulsing

◆Easy to selection between pin and pin It is possible to make a positioning of any two pins by using manipulator.

Option the HMM Zap (IEC 61000-4-2) available

HED-W5000M-SP0

Low Cost Wafer ESD Tester

◆Low Cost & High Performance The development cost can be reduced.

◆Software was opened Software was opened. Therefore, the application can be widely constructed

Option the HMM Zap (IEC 61000-4-2) available